JPH0361337B2 - - Google Patents
Info
- Publication number
- JPH0361337B2 JPH0361337B2 JP57136430A JP13643082A JPH0361337B2 JP H0361337 B2 JPH0361337 B2 JP H0361337B2 JP 57136430 A JP57136430 A JP 57136430A JP 13643082 A JP13643082 A JP 13643082A JP H0361337 B2 JPH0361337 B2 JP H0361337B2
- Authority
- JP
- Japan
- Prior art keywords
- region
- mask layer
- area
- base
- layer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
- H10D10/01—Manufacture or treatment
- H10D10/051—Manufacture or treatment of vertical BJTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
- H10D10/40—Vertical BJTs
- H10D10/421—Vertical BJTs having both emitter-base and base-collector junctions ending at the same surface of the body
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/914—Doping
- Y10S438/919—Compensation doping
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/98—Utilizing process equivalents or options
Landscapes
- Bipolar Transistors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP81106214.0 | 1981-08-08 | ||
EP81106214A EP0071665B1 (de) | 1981-08-08 | 1981-08-08 | Verfahren zum Herstellen einer monolithisch integrierten Festkörperschaltung mit mindestens einem bipolaren Planartransistor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5837961A JPS5837961A (ja) | 1983-03-05 |
JPH0361337B2 true JPH0361337B2 (en]) | 1991-09-19 |
Family
ID=8187852
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP57136430A Granted JPS5837961A (ja) | 1981-08-08 | 1982-08-06 | 少なくとも1個のバイポ−ラプレ−ナトランジスタを備えたモノリシツク集積回路の製造方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US4477965A (en]) |
EP (1) | EP0071665B1 (en]) |
JP (1) | JPS5837961A (en]) |
DE (1) | DE3174397D1 (en]) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4624046A (en) * | 1982-01-04 | 1986-11-25 | Fairchild Camera & Instrument Corp. | Oxide isolation process for standard RAM/PROM and lateral PNP cell RAM |
US4567644A (en) * | 1982-12-20 | 1986-02-04 | Signetics Corporation | Method of making triple diffused ISL structure |
EP0116654B1 (de) * | 1983-02-12 | 1986-12-10 | Deutsche ITT Industries GmbH | Verfahren zum Herstellen von bipolaren Planartransistoren |
EP0122313B1 (de) * | 1983-04-18 | 1987-01-07 | Deutsche ITT Industries GmbH | Verfahren zum Herstellen einer monolithisch integrierten Schaltung mit mindestens einem integrierten Isolierschicht-Feldeffekttransistor |
DE3317437A1 (de) * | 1983-05-13 | 1984-11-15 | Deutsche Itt Industries Gmbh, 7800 Freiburg | Planartransistor mit niedrigem rauschfaktor und verfahren zu dessen herstellung |
US4584763A (en) * | 1983-12-15 | 1986-04-29 | International Business Machines Corporation | One mask technique for substrate contacting in integrated circuits involving deep dielectric isolation |
JPS60258964A (ja) * | 1984-06-06 | 1985-12-20 | Hitachi Ltd | 半導体装置の製造方法 |
US4648909A (en) * | 1984-11-28 | 1987-03-10 | Fairchild Semiconductor Corporation | Fabrication process employing special masks for the manufacture of high speed bipolar analog integrated circuits |
DE3571366D1 (en) * | 1985-09-21 | 1989-08-10 | Itt Ind Gmbh Deutsche | Method of applying a contact to a contact area for a semiconductor substrate |
US4753834A (en) * | 1985-10-07 | 1988-06-28 | Kimberly-Clark Corporation | Nonwoven web with improved softness |
EP0239652B1 (de) * | 1986-03-22 | 1991-07-24 | Deutsche ITT Industries GmbH | Verfahren zum Herstellen einer monolithisch integrierten Schaltung mit mindestens einem bipolaren Planartransistor |
US4721685A (en) * | 1986-04-18 | 1988-01-26 | Sperry Corporation | Single layer poly fabrication method and device with shallow emitter/base junctions and optimized channel stopper |
US4727046A (en) * | 1986-07-16 | 1988-02-23 | Fairchild Semiconductor Corporation | Method of fabricating high performance BiCMOS structures having poly emitters and silicided bases |
DE3683054D1 (de) * | 1986-12-12 | 1992-01-30 | Itt Ind Gmbh Deutsche | Verfahren zum herstellen einer monolithisch integrierten schaltung mit mindestens einem bipolaren planartransistor. |
EP0271599B1 (de) * | 1986-12-18 | 1991-09-04 | Deutsche ITT Industries GmbH | Kollektorkontakt eines integrierten Bipolartransistors |
US4740478A (en) * | 1987-01-30 | 1988-04-26 | Motorola Inc. | Integrated circuit method using double implant doping |
US4784966A (en) * | 1987-06-02 | 1988-11-15 | Texas Instruments Incorporated | Self-aligned NPN bipolar transistor built in a double polysilicon CMOS technology |
US5005066A (en) * | 1987-06-02 | 1991-04-02 | Texas Instruments Incorporated | Self-aligned NPN bipolar transistor built in a double polysilicon CMOS technology |
KR890005885A (ko) * | 1987-09-26 | 1989-05-17 | 강진구 | 바이폴라 트랜지스터의 제조방법 |
US5238849A (en) * | 1990-08-30 | 1993-08-24 | Nec Corporation | Method of fabricating semiconductor device |
DE19540309A1 (de) * | 1995-10-28 | 1997-04-30 | Philips Patentverwaltung | Halbleiterbauelement mit Passivierungsaufbau |
DE19611692C2 (de) * | 1996-03-25 | 2002-07-18 | Infineon Technologies Ag | Bipolartransistor mit Hochenergie-implantiertem Kollektor und Herstellverfahren |
USD414405S (en) | 1997-11-24 | 1999-09-28 | Tompkins Jeffrey D | Cylindrical holder |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SE405526B (sv) * | 1973-07-16 | 1978-12-11 | Western Electric Co | Transistor och sett for dess tillverkning |
JPS5167069A (en) * | 1974-12-07 | 1976-06-10 | Fujitsu Ltd | Handotaisochino seizohoho |
JPS5278387A (en) * | 1975-12-24 | 1977-07-01 | Fujitsu Ltd | Production of semiconductor device |
JPS5952550B2 (ja) * | 1976-12-27 | 1984-12-20 | 富士通株式会社 | 半導体装置の製造方法 |
US4111720A (en) * | 1977-03-31 | 1978-09-05 | International Business Machines Corporation | Method for forming a non-epitaxial bipolar integrated circuit |
US4118250A (en) * | 1977-12-30 | 1978-10-03 | International Business Machines Corporation | Process for producing integrated circuit devices by ion implantation |
US4199380A (en) * | 1978-11-13 | 1980-04-22 | Motorola, Inc. | Integrated circuit method |
JPS5852339B2 (ja) * | 1979-03-20 | 1983-11-22 | 富士通株式会社 | 半導体装置の製造方法 |
US4376664A (en) * | 1979-05-31 | 1983-03-15 | Fujitsu Limited | Method of producing a semiconductor device |
US4242791A (en) * | 1979-09-21 | 1981-01-06 | International Business Machines Corporation | High performance bipolar transistors fabricated by post emitter base implantation process |
-
1981
- 1981-08-08 EP EP81106214A patent/EP0071665B1/de not_active Expired
- 1981-08-08 DE DE8181106214T patent/DE3174397D1/de not_active Expired
-
1982
- 1982-08-03 US US06/404,931 patent/US4477965A/en not_active Expired - Lifetime
- 1982-08-06 JP JP57136430A patent/JPS5837961A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
EP0071665A1 (de) | 1983-02-16 |
DE3174397D1 (en) | 1986-05-22 |
EP0071665B1 (de) | 1986-04-16 |
US4477965A (en) | 1984-10-23 |
JPS5837961A (ja) | 1983-03-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0361337B2 (en]) | ||
JPH0697665B2 (ja) | 集積回路構成体の製造方法 | |
JPH05347383A (ja) | 集積回路の製法 | |
KR950010287B1 (ko) | 베이스 재결합 전류가 낮은 바이폴라 트랜지스터를 갖는 바이폴라 상보형 금속 산화물 반도체 제조 방법 | |
US4343080A (en) | Method of producing a semiconductor device | |
US4191595A (en) | Method of manufacturing PN junctions in a semiconductor region to reach an isolation layer without exposing the semiconductor region surface | |
JP3098848B2 (ja) | 自己整合型プレーナモノリシック集積回路縦型トランジスタプロセス | |
JPH04226064A (ja) | 半導体装置用の相互接続体及びその製造方法 | |
EP0421507B1 (en) | Method of manufacturing a bipolar transistor | |
JPH0241170B2 (en]) | ||
US5449627A (en) | Lateral bipolar transistor and FET compatible process for making it | |
JPH0541385A (ja) | 半導体装置とその製造方法 | |
JP2730535B2 (ja) | 半導体装置の製造方法 | |
RU2107972C1 (ru) | Способ изготовления биполярных планарных n-p-n-транзисторов | |
JP2852241B2 (ja) | 半導体装置及びその製造方法 | |
JPH04290273A (ja) | 窒化シリコンコンデンサの製造方法 | |
KR950012742B1 (ko) | 2극성 및 상보 전계효과 트랜지스터들(BiCMOS)을 동시에 제조하는 방법 | |
JP3965476B2 (ja) | 半導体装置の製造方法 | |
JP3093615B2 (ja) | 半導体装置の製造方法 | |
JP2745946B2 (ja) | 半導体集積回路の製造方法 | |
JPH0258781B2 (en]) | ||
JP2533951B2 (ja) | バイポ―ラ半導体装置の製造方法 | |
JP2770762B2 (ja) | 半導体装置の製造方法 | |
JP2573303B2 (ja) | 半導体装置の製造方法 | |
JPS6072228A (ja) | 半導体基板への不純物ド−ピング方法 |